胡中波教授致辞
由UCAS和牛津仪器共建的“国科大.牛津显微分析学校”正式成立了。
国科大是一所以研究生教育为主的科教融合、独具特色的高等学校。培养了新中国第一个理学博士、第一个工学博士、第一个女博士、第一个双学位博士。牛津仪器在材料微观结构表征设备的制造中居于世界领先的地位。双方合作共建的这个学校将是高水平的，前所未有的。
为了确保学校的成功，我们做了认真、精心的准备。并得到了国科大和牛津仪器相关部门的大力支持。
对有机会进入这个学校学习的同学们来说，这将是一个非常重要、非常难得的机会。学习有多种方法、多种途径。强化培训就是一种非常重要的学习方法。“国科大.牛津显微分析学校”的课程即设计为强化培训课程。结合具体仪器培训实验技能是这门课的特点和优点。即课程除介绍相关基本原理外，将结合具体仪器的特性及用途，强化训练学生运用现代材料表征器解决工作中碰到的实际问题的能力。所有课程的实践性都极强。所有的授课者都是实际工作经验非常丰富的材料科学研究或仪器研发领域的杰出学者。教学方式是多样的，包括课堂讲课、实验演示及师生之间的互动交流。
Dr. Ian C Wilcock 致辞
Oxford Instruments was founded in the UK by Sir Martin Wood and traces its history back to 1959, being recognised as the first technology company spin out from Oxford University in the UK. Oxford Instruments is celebrating its 20th year in China after opening our first office here in 1997 in Shanghai. We are proud over the last 20 years to have been providing analytical solutions and services to many of China’s top scientists and institutions, undertaking exciting and world leading applications in a range of scientific disciplines.
Our aim with this new school is to provide a range of lectures and demonstrations which will focus on three principle areas of microscopy:
The course content is provided by leading applications scientists from Oxford Instruments and external speakers. We will focus principally on the theory and application of modern microscopy equipment and in addition provide an opportunity for hands on demonstrations and experience. The course will cover both introductory microscopy topics for the general scientist but also some in depth coverage of specific techniques and applications, bringing the latest thinking and knowledge to attendees.
On behalf of Oxford Instruments, my colleagues and I would like to take this opportunity to thank UCAS and particularly Professor Hu Zhongbo for support in establishing this school. We look forward to seeing this initiative flourish and grow in future years.
We hope you all enjoy this first week – thank you all for attending this exciting event.
Dr. Ian C Wilcock
Managing Director
Oxford Instruments Nano Analysis
